The new ZEISS Imaging Suite shortly to open here at the 3M BIC offers businesses an opportunity to investigate, characterise and accurately measure prototypes and products and to look at items that have been damaged in use using laser to understand how and design preventative measures. The ZEISS Imaging Suite will house a range of optical, laser and electron microscopes. These techniques, also enhanced by access to X-Ray technology for internal examination, offer a forensic insight into the surface characteristics of items thus providing valuable information on manufacturing techniques, wear and tear patterns in use or in the case of failure and as part of quality assurance procedures. Microscopic examination is applicable to materials, manufactured products and biological systems. This free to attend event with parking on site will provide an overview of each available technique and its application through real-world examples.
5.00pm - 5.30pm   Networking & Refreshments
5.30pm - 5.40pm   Dr Michael Wilson - 3M BIC Director of Technology - A Brief Introduction
5.40pm - 6.00pm  Paul Ashton - Specialist ZEISS Microscopy - An overview of imaging based on the capabilities available at the 3M BIC and how this could benefit your business
6.00pm - 6.20pm  Dr Jane Harmer - Senior Research Fellow, School of Applied Sciences, University of Huddersfield - Biological applications of confocal in the contect of business relevance
6.20pm - 6.40pm  James Halstead - Delivery Manager, NPL - ZEISS Smartproof Integrated Confocal Microscope case study
6.40pm         Q&A and CloseÂ
The event will be held on 15 February from 5pm to 7pm at the 3M Buckley Innovation Centre, FIrth Street, Huddersfield, HD1 3BD. If you would like to attend please register through the Eventbrite link below:-
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